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Application Note: Measurement of Nitrosamine Impurities

Explanation of the measurement of nitrosamine impurities using the high-resolution "Agilent 6546 LC/Q-TOF"!

Angiotensin II receptor blockers (ARBs) are widely used in the treatment of hypertension and heart failure. Recently, it has been found that some ARBs contain carcinogenic nitrosamine impurities, resulting in the recall of many products. Consequently, there is a demand for analytical methods capable of detecting these problematic nitrosamine impurities. This application note describes a high-sensitivity and high-resolution LC/MS/MS method using the "Agilent 6546 LC/Q-TOF" for the detection and quantification of six types of nitrosamines specified by the US FDA, as well as a simultaneous detection method for eleven types of nitrosamine impurities. [Contents] ■ Introduction ■ Experimental Methods ■ Results and Discussion ■ Conclusion ■ References ■ Acknowledgments *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Impurity Measurement

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[Analysis Case] Ultra-high Sensitivity Measurement of Impurities in Silicon Using SIMS

We will enhance the sensitivity and evaluate the concentration distribution at the ppt level.

The detection sensitivity in SIMS analysis depends on the amount of sputtered sample per unit time. Depending on the element, significantly improved sensitivity can be achieved by limiting the impurities to one element, allowing evaluation down to ppt (parts per trillion) levels of less than 5E13 atoms/cm3, which is effective for assessing low-concentration impurities in IGBT devices and high-purity wafers. This document presents examples of ultra-high sensitivity evaluations of low-concentration impurities in silicon.

  • Contract Analysis
  • Impurity Measurement

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